DCA Instruments will be exhibiting in the 20th International Conference on Molecular Beam Epitaxy in Shanghai. This year, the conference is organized by Shanghai Institute of Microsystems and Information Technology (SIMIT), Chinese Academy of Science. The exhibition gathers together the professionals in the field of fundamental and applied MBE research.
Come and meet us at the booth!
For more information: http://mbe2018.csp.escience.cn/